
Semiconductor Test Engineer with 10+ years of experience in backend test engineering, ATE program development, and yield optimization. Skilled in Final Test operations, NPI support, device qualification, fab transfers, and new package introduction for MOSFET, GaN, and power devices. Proven success in test time reduction, cost savings, and correlation studies to support high-volume manufacturing. Strong background in debugging and cross-site collaboration with global engineering teams. Six Sigma Greenbelt Certified with multiple awards for technical innovation and capacity improvement.