Danilo Benig

Former electronics engineering faculty member at the Mapúa Institute of Technology and De La Salle University, with 20 years as a semiconductor test professional, combining hands-on and management experience in IC Test Engineering and New Product Development. Led Test Operations teams focused on pre-production readiness via First Silicon characterization, yield analysis, quality and test time optimization for digital, analog and mixed-signal automotive ASICs. Systematically helped reduce cost for new and maturing production releases to manufacturing in multisite wafer probe and final test solutions. Led and managed local manufacturing and OSAT teams in improving operational efficiencies through multisite conversions and platform migrations as required by dynamic changes in output capacity requirements.

Proven track record in leading start-up IC test development teams based in Manila, Philippines while reporting to management based overseas (USA, EU and Switzerland), acquiring and maintainng ISO & QS industry certifications in the process. Currently a free-lance consultant for semiconductor-related business interests.

• Statistical Analysis Software Tools: Data Conductor, Galaxy Examinator
• Eagle Test Systems Applications Programming, Teradyne Training Center, Singapore
• LTX Master Series, Delta Series Applications Programming, LTX North American Training Center, San Jose, California, USA
• Teradyne J750 Applications Programming, AMI Semiconductor, Pocatello, Idaho, USA
• Design of Experiments & SPC, AMI Semiconductor, Manila
• Seven Habits of Highly Effective People, Covey Leadership Center
• Targeted Selection (Certified Interviewer), Data Dimensions International
• Interaction Management, Data Dimensions International
• Systematic Managerial Analysis, Asia Business Consultants

• Dennis Ibarra, VP Business Development, Berkeley Energy, +639178881890
• Richard Cohen, Ret. Former General Manager (SVP), Maxim Integrated Products, Philippines, +639175514054
• Stéphane Moins, Test & Product Engineering Manager, ICS LEM International SA, Geneva, Switzerland, +33687093621, sms.lem.com
• Allan Chan, Director of Product Engineering, ON Semiconductor, Pocatello, Idaho, USA, +12087607832, allan.chan@onsemi.com
• Joseph Kimseng, Sr. Staff QMS Manager, Marvell Technology, Inc., USA, jkimseng@marvell.com

• Test & Product Engineering Consultant, LEM SA, Geneva, Switzerland, 12/01/21, 10/31/22, Led NPI and performed onsite Test Operations and PE functions for Hall Effect-based Integrated Current Sensors (HMSR Series) to support release to manufacturing initiatives at an OSAT facility in Indonesia, while reporting to the R&D Head in Geneva. Directed and coached a team of line sustaining test engineers responsible for day-to-day upkeep of multisite ATE and handler equipment and first level yield analysis, while performing hands-on PE functions for yield improvement and QA defect prevention using statistical analysis software. Developed and deployed performance visibility tools for tracking OEE and multisite yield maps and utilization. Enabled local autonomy for the Operations and Sustaining Team as a result.
• Business Development Consultant, PTW Philippines, Philippines, 07/01/19, 06/30/20, Primarily acted as the focal person for introducing Microtest ATE of Italy to the Philippine semiconductor test market by developing entry strategies customized for specific client needs such as the phaseout of legacy Automatic Test Equipment.
• Business Development Consultant, ChipTest Ltd, 07/01/18, 06/30/19, Responsible for project prospecting and development for semiconductor client companies looking for comprehensive and reliable IC test engineering services in areas including but not limited to software and hardware development, legacy to newer ATE migration, multisite testing and parametric characterization.
• Manager, Test Development, Microsemi Corporation, California, USA, 06/01/12, 11/30/16, Led a team of engineers developing wafer probe and final test solutions for switch-mode power management (PWM controllers, power electronics) and solar power ICs; Outlined and peer-reviewed test plans, testability and fault-coverage analyses with Design Engineers, Product Engineers and System Architects to optimize new products for manufacturing. Led NPI project management from concept to manufacturing and provided same-time-zone technical support for subcontract facilities in Asia while taking about two-thirds of the total new product development load off the US team. Reported to the Analog/Mixed-Signal R&D Division in California, USA. Established the local team as the key regional resource for the test development organization in Asia.
• Test/Product Engineering Consultant, Maxim Integrated Products, 05/01/11, 11/30/11, Trained manufacturing test engineers in analog test methodology for linear amplifiers, LDO and switch-mode power management circuits and yield improvement projects.
• Test Development/Product Engineering Manager, AMI-ON Semiconductor, 07/01/07, 03/31/10, Led and managed local test development for automotive products and PE functions such as First Silicon analysis, optimization of Cpk, test margins, gauge R&R and test time and outgoing defect reduction where possible with test/fault coverage improvements. Established the local team as the key regional resource for these functions in the Philippines.
• Test Development Engineering Manager, ON Semiconductor, Carmona, Philippines, Led a start-up team developing ATE probe and test for analog IC products, enabling specialized skills in test engineering. Successfully expanded local roles in these disciplines for stakeholders in the US, HK and Europe, ultimately reducing cost by transferring 100% of the analog test development functions from the HK Design Center to Carmona, Philippines in 2005. Initiated and realized capital equipment efficiency improvements where needed through development of multi-site testing solutions. Conducted applied statistics training for the local test and product engineering community; Led concept to implementation of an intranet based SPC system for monitoring setup integrity and maverick lot detection. Established foundations for the local team to become the 'Center of Excellence' for test development in Asia. Recipient: ON Semiconductor Technical Excellence Award.
• Test Engineer - Sr. Staff Engineer, AMI Semiconductor, Developed wafer probe and final test solutions for high-speed digital platforms such as LTX Delta Series, Trillium Master Series. Performed hands-on test program conversions from older to newer ATE platforms to help manage test cost and production capacity. Supervised overseas subcontract support within the Asia Pacific region (Hong Kong, Korea, Taiwan) and special projects with Motorola-Japan involving conversion of Motorola FPGAs to AMI ASICs.